Applications - SPOTOPTICS

SpotOptics can provide turn-key solutions for quality control of almost any optical element and lasers.

Our instruments can test at DUV, UV, Visible, SWIR, MWIR and LWIR (CO₂) wavelengths. The test can be either in reflection or transmission. We have several successfully installations in the industrial world and in research.

According to your requirements, we can study customized solutions for your specific application. We can also integrate special hardware in our systems or develop special analysis software.

Shack-Hartmann images from DUV to LWIR taken with SpotOptics wavefront sensors

Head-up display test with OMI

SpotOptics developed the system for testing the Heads-Up Display (HUD) in the production line for a German company working in the automotive industry. SpotOptics wavefront sensor OMI and Shack-Hartmann analysis software SenSoft were used to get the quality of the system.

Spotoptics Omi Mounted for Testing a Windshield — SpotOptics Omi mounted for testing head-up display + windshield system

Testing lenses with Optino: measure stress due to lens mounting

SpotOptics Shack-Hartmann wavefront sensor Optino and SenSoft software were used to test an ophthalmic lens held in a 3-point clamp.

Output results from Sensoft analysis are the table with the Zernike coefficients (at left in the figure below) and several graphs.

Sensoft Zernike Output — Zernike coefficient from Shack-Hartmann analysis with Sensoft

Triangular Coma As Result of Stress Due to Mounting — Triangular Coma due to the 3-point clamp in wavefront map

3d Wavefront of Triangular Coma — Triangular Coma due to the 3-point clamp in 3D of wavefront

Astronomical telescope test with Puntino: measure stress due to supports

Contour of Telescope Mirror Surface left and Mirror Support Map right — **contour of Telescope Mirror Surface left and the Mirror Support Map right**

SpotOptics wavefront sensor Puntino and SenSoft software were used for analyzing a 1.5m mirror telescope in 1996. Since the Telescope has an annular pupil, the Annular Zernike polynomials were implemented in SenSoft together with the Standard Zernike, Fringe Zernike and Seidel polynomials. After the calculation of the Annular Zernike aberration terms, the wavefront was reconstructed mathematical removing all of the Zernike terms (this is a feature of our software Sensoft): the resulting mirror surface map (left) clearly follows the mirror support map (right).

Digital camera lens test: on-axis and off-axis test

5Star

Analyze a digital camera lens on-axis (central image) and off-axis in 4 fixed points. Contour of 5 wavefront (at left) Output with combination of graphs (at right)
On-line continuous loops: Aberrations, Contour and 3D of wavefront, Spot diagram, MTF/OTF, Residuals on the pupil
Off-line analysis. Zernike coefficients, PV & Rms, Encircled Energy, contour and 3D of wavefront, Spot diagram, MTF/OTF, Residuals on the pupil. Any combination of these garphs is selectable off-line for each of the quadrants

Stella

Analyze a microscope objective in multiple points in the field with scanning. Low order aberration maps (at left) and 3rd order and higher order Astigmatism maps (at right)
Scanning occurs automatically using a macro with the positions of the motors in the various points of the field
Selectable output graphs